By automatically controlling the curve tracer, scanner system, and hot plate from the semiconductor parameter measurement software CS-810, it is possible to reduce the time required for temperature characterization.
![Temperature Characterization Test](/wp-content/uploads/2024/06/img-characterization-test.png)
Hot plate/thermostatic chamber
![Hot plate/thermostatic chamber](/wp-content/uploads/2024/06/tme-cs-cs_measur_temp-img02e.jpg)
Accessories
Prober cable
![Prober cable](/wp-content/uploads/2024/06/img-prober-cable.png)
Test fixture L
![Test fixture L](/wp-content/uploads/2024/06/img-test-fixture-l1.png)
![Test fixture L](/wp-content/uploads/2024/06/img-test-fixture-l2.png)